Sfoglia per Serie MATERIAL SCIENCE FORUM
Residual Stress Depth-Profiling in Shot-Peened Al Alloy Components Subjected to Fatigue Testing
2010-01-01 Azanza Ricardo, Cristy Leonor; G., Degan; M., Bandini; Scardi, Paolo
Rietveld texture and stress analysis of thin films by x-ray diffraction
2002-01-01 Lutterotti, Luca; S., Matthies; D., Chateigner; S., Ferrari; J., Ricote
WPPM: Advances in the Modeling of Dislocation Line Broadening
2010-01-01 Leoni, Matteo; J., Martinez Garcia; Scardi, Paolo
X-Ray Combined QTA Using a CPS Applied to a Ferroelectric Ultrastructure
2002-01-01 M., Morales; D., Chateigner; Lutterotti, Luca; J., Ricote
Titolo | Anno di pubblicazione | Autori Unitn | File |
---|---|---|---|
Residual Stress Depth-Profiling in Shot-Peened Al Alloy Components Subjected to Fatigue Testing | 1-gen-2010 | Azanza Ricardo, Cristy LeonorScardi, Paolo + | |
Rietveld texture and stress analysis of thin films by x-ray diffraction | 1-gen-2002 | Lutterotti, Luca + | |
WPPM: Advances in the Modeling of Dislocation Line Broadening | 1-gen-2010 | Leoni, MatteoScardi, Paolo + | |
X-Ray Combined QTA Using a CPS Applied to a Ferroelectric Ultrastructure | 1-gen-2002 | Lutterotti, Luca + |
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